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Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13
Figure 1: (A) In ORT modes, consecutive force-versus-distance curves are generated with a periodic Z displace...
Figure 2: (A) Deflection values during the interaction window (shadowed in blue color), which is selected aro...
Figure 3: The tracking performance of both methods was evaluated in an experimental setup (A) where a scanner...
Figure 4: A grid sample was scanned with both methods to compare the image quality and the tracking performan...
Figure 5: Both methods are used to image PS/LDPE. The height image of the sample in panel (A) was captured us...
Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111
Figure 1: AFM assembly and integration inside a Zeiss ORION NanoFab helium ion microscope. a) Simplified CAD ...
Figure 2: Correlative imaging in process on silicon pillars. a) Optical image showing how the AFM cantilever ...
Figure 3: AFM height images of poly(methyl methacrylate) after exposure to a) 1 × 1013 and b) 3 × 1013 He ion...